One Bit Sensing, RIP bounds and Empirical Processes

Series
Analysis Seminar
Time
Wednesday, January 27, 2016 - 2:00pm for 1 hour (actually 50 minutes)
Location
Skiles 005
Speaker
Michael Lacey – Gatech
Organizer
Michael Lacey
A signal is a high dimensional vector x, and a measurement is the inner product . A one-bit measurement is the sign of . These are basic objects, as will be explained in the talk, with the help of some videos of photons. The import of this talk is that one bit measurements can be as effective as the measurements themselves, in that the same number of measurements in linear and one bit cases ensure the RIP property. This is explained by a connection with variants of classical spherical cap discrepancy. Joint work with Dimtriy Bilyk.